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IEEE International High Level Design Validation and Test Workshop (HLDVT 2006)
November 9 - 10, 2006
(Evening registration on November 8, 2006)

Hyatt Regency Monterey,
Monterey, CA, USA

http://www.hldvt.com/06

CALL FOR PARTICIPATION

Early Registration Ends October 19, 2006!

Overview -- Advance Program -- Contacts

Overview

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HLDVT provides a unique forum for industrial practitioners and researchers in test and verification to interact, exchange ideas and discuss directions and trends.

We look forward to an excellent program that features an interesting mix of papers on test generation, assertions, test, transformation-based verification, SAT, and system-level modeling.  In addition to the submitted papers, the program includes invited papers in special sessions on "Industrial Trends in Test and Validation" and"Advances in Hybrid Verification."  The traditional HLDVT panel discussion will consider the timely topic of "Assertion-Based Verification." J. Scott Runner of Qualcomm will deliver the keynote at the conference banquet.  He will speak on the challenges of verification efficiency.

Important dates:
Early Registration Deadline: October 19, 2006
Pre-Conference Registration Deadline: November 3, 2006
           (Registration also available at conference)
Hotel Registration Deadline: October 23, 2006

The advance program, hotel information, and registration links are available on the HLDVT'06 web pages at: http://www.hldvt.com/06.

Advance Program

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Wednesday -- Thursday -- Friday

WEDNESDAY, NOVEMBER 8
6:00 pm - 8:00 pm Registration
THURSDAY, NOVEMBER 9
7:00 am - 8:00 am Continental Breakfast
7:00 am - 5:00 pm Registration
8:00 am - 8:10 am Welcome Remarks
8:10 am - 9:25 am Session 1: Test Case Generation I

DVGen: Increasing Coverage by Automatically Combining Test  Specifications
K. D. Rich, R. Shaw, S. G. Govindaraju, D. Dobrikin, Transmeta Corp.

Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming
H.- W. Hsueh, K. Eder, U. of Bristol

Automated Coverage Directed Test Generation Using Cell-Based Genetic Algorithm
A. Samarah, A. Habibi, S. Tahar, Concordia U

9:25 am - 9:45 am Break
9:45 am - 11:00 am Session 2: Special Session I

Disjunctive Transition Relation Decomposition for Efficient Reachability Analysis
S. Stergiou, Stanford U
J. Jain, Fujitsu Labs

Trends in Test: Challenges and Techniques
W. Meyer, Synopsys

Formal Verifications in Modern Chip Designs
K.-Y. Khoo, Cadence

11:00 am - 11:20 am Break
11:20 am - 12:25 pm

Session 3: Testing and Design for Testability

DFT and Probabilistic Testability Analysis at RTL
J. M. Fernandes, M. Santos, A. Oliveira, J. P. Teixeira, IST/INESC-ID

Easily Testable Implementation for Bit Parallel Multipliers Over GF ( 2^ m)
H. Rahaman, J. Mathew, A. Jabir, D. K. Pradhan, U. Bristol

Error Detection Using Model Checking vs. Simulation
S. Verma, P. Lee, I. Harris, U California, Irvine

12:25 pm - 2:00 pm Lunch
2:00 pm - 3:40 pm Session 4: Assertions and Transactions

Assertion-based Verification of Behavioral Descriptions with Non-linear Solver
I. Ugarte, P. Sanchez, U. Cantabria

Efficient Automata-Based Assertion-Checker Synthesis of PSL Properties
M. Boule, Z. Zilic, McGill U

Specification Language for Transaction Level Assertions
W. Echer, V. Esen, M. Hull, T. Steininger, M. Velten, Infineon

On the Automatic Transactor Generation for the TLM-based Design Flow
N. Bombieri, F. Fummi, U. Verona

3:40 pm - 4:00 Break
4:00 pm - 5:40 pm

Session 5: Test Case Generation II

Addressing Test Generation Challenges for Configurable Processor Verification
S. Johnson, D. Jani, Tensilica
M. Rimon, Y. Lichtenstein, A. Adir, I. Jaeger, M. Vinov, IBM

DeepTrans - Extending the Model-based Approach to Functional Verification of Address Translation Mechanisms
A. Koyfman, Y. Katz, A. Adir, L. Fournier, IBM

CP with Architectural State Lookup for Functional Test Generation
B. Gutkovich, A. Moss, Intel

Reusable On-Chip System Level Verification for Simulation Emulation and Silicon
A. Maman, S. Goldschlager, H. Miller, D. Bell, R. Slater, O. Ben-Moshe, N. Levi,
H. Gilboa, Freescale

6:00 pm - 8:00 pm Dinner Banquet
  Keynote: J. Scott Runner, Qualcomm
"Time to Quality: The Challenge of Verification Efficiency"
FRIDAY, NOVEMBER 10
7:00 am - 12:00 pm Registration
7:00 am - 8:00 am Continental Breakfast
8:00 am - 9:05 am Session 6: Transformation-based Verification

Transaction Routing and its Verification by Correct Model Transformations
S. Abdi, D. Gajski, U California, Irvine

Taming the Complexity of STE-based Design Verification Using Program Slicing
V. Vedula, F. Andersen, J. Abraham, U Texas, Austin

MMV: Metamodeling Based Microprocessor Validation Environment
A. T. Dingankar, Intel, D. Mathaikutty, S. Shukla, Virginia Tech,
S. Kodakara, D. Lilja, U. Minnesota

9:05 am - 9:25 am Break
9:25 am - 10:40 am Session 7: Special Session II: Hybrid Verification, Survey and Latest Results

Distance-Guided Hybrid Verification with GUIDO
V. Bertacco, U Michigan

EverLost: A Flexible Platform for Industrial-Strength Abstraction-Guided Simulation
A. Hu, U British Columbia

Semi-Formal Verification at IBM
J. Baumgartner, IBM

10:40 am - 11:00 am Break
11:00 am - 12:30 pm

Session 8: SAT and Equivalence Verification

Guiding CNF-SAT Search by Analyzing Constraint-Variable Dependencies and Clause Lengths
V. Durairaj, P. Kalla, U Utah

Equivalence Checking with Rule-Based Equivalence Propagation and High-Level Synthesis
T. Nishihara, T. Matsumoto, M. Fujita, U Tokyo

Practical Issues in Sequential Equivalence Checking through Alignability: Handling Don't Cares and Generating Debug Traces
I.-H. Moon, P. Bjesse, C. Pixley, Synopsys

IChecker: An Efficient Checker for Inductive Invariants
F. Lu, T. Cheng, U California, Santa-Barbara

12:30 pm - 2:00 pm Lunch
2:00 pm - 3:30 pm Session 9: Panel: Assertion-Based Verification - What is the Big Deal?  

Organizer: S. Shukla

Moderator: A. Hu

Panelists: C. Pixley, J. Abraham, H. Foster, P. Ashar, A. Landver

3:30 pm - 3:50 pm Break
3:50 pm - 5:20 pm Session 10: System Level View and Modeling

Runtime Deadlock Analysis of SystemC Design
E. Cheung, P. Satapathy, V. Pham, H. Hsieh, U California, Riverside
X. Chen, Novas

Extracting a simplified view of design functionality via vector simulation
O. Guzey, C. H.-P. Wen, L.-C. Wang, U California, Santa-Barbara
T. Feng, Cadence, M. Abadir, Freescale

A Tool for Automatic Detection of Deadlock in Wormhole Networks on Chip
S. Taktak, J.-L. Desbarbieux, U Paris 6
E. Encrenaz, ENS Cachan & CNRS

Polychronous Methodology for System Design: A True Concurrency Approach
S. Suhaib, D. Mathaikutty, S. Shukla, Virginia Tech
J.-P. Talpin, INRIA

Contacts

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Program Chair

Michael Hsiao
programchair@hldvt.com

General Chair

Robert Jones
generalchair@hldvt.com

For more information, visit us on the web at:http://www.hldvt.com/06

The IEEE International High Level Design Validation and Test Workshop (HLDVT 2006) is sponsored by the IEEE Computer Society Test Technology Technical Council, and the IEEE Computer Society Design Automation Technical Committee.  IBM provides generous financial support for the workshop.


IEEE Computer Society– Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia– Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


TTTC 2ND VICE CHAIR
Michel RENOVELL
LIRMM– France
Tel. +33 467 418 523
E-mail renovell@lirmm.fr

FINANCE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

IEEE DESIGN & TEST EIC
Rajesh K. GUPTA
University of California, Irvine– USA
Tel. +1-949-824-8052
E-mail gupta@uci.edu

TECHNICAL MEETINGS
Cheng-Wen WU

National Tsing Hua Univ.– Taiwan
Tel. +886-3-573-1154
E-mail cww@computer.org

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica– Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Inst. of Science and Technology– Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal Univ. of Rio Grande do Sul (UFRGS)– Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino– Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM– France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

ITC GENERAL CHAIR
Rob AITKEN
Artisan Components– USA
Tel. +1-408-548-3297
E-mail aitken@artisan.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

Univ. of Piraeus– Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys– USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Joan FIGUERAS
Univ. Politècnica de Catalunya– Spain
Tel. +55-51-228-1633, Ext. 4830
E-mail figueras@eel.upc.es

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut– Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
iRoC Technologies– Greece
Tel. +33-4-381-20763
E-mail michael.nicolaidis@iroctech.com

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino– Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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